Today, development and implementation of automotive embedded systems is based on a model-based process. A major problem of respective model-based toolchains can be traced back to inadequate testing tools, which often are not standardized, incomplete and cumbersome in usage. Due to these shortcomings, test specifications are neither exchangeable nor reuseable. In this paper, we propose $μ$TTCN for test specifications of continuous embedded systems. $μ$TTCN targets at exchangeable and reuseable test specifications based upon TTCN-3, as well as convenient handling of testcase implementations.