| No. |
Title |
Author |
Year |
| 1 |
A Largish Sum-Of-Squares Implies Circuit Hardness and Derandomization |
Dutta, Pranjal et al. |
2021 |
| 2 |
Deterministic Identity Testing Paradigms for Bounded Top-Fanin Depth-4 Circuits |
Dutta, Pranjal et al. |
2021 |
| 3 |
Front Matter, Table of Contents, Preface, Conference Organization |
Saxena, Nitin et al. |
2020 |
| 4 |
LIPIcs, Volume 182, FSTTCS 2020, Complete Volume |
Saxena, Nitin et al. |
2020 |
| 5 |
Counting Basic-Irreducible Factors Mod p^k in Deterministic Poly-Time and p-Adic Applications |
Dwivedi, Ashish et al. |
2019 |
| 6 |
Algebraic Dependencies and PSPACE Algorithms in Approximative Complexity |
Guo, Zeyu et al. |
2018 |
| 7 |
Towards Blackbox Identity Testing of Log-Variate Circuits |
Forbes, Michael A. et al. |
2018 |
| 8 |
Algebraic Independence over Positive Characteristic: New Criterion and Applications to Locally Low Algebraic Rank Circuits |
Pandey, Anurag et al. |
2016 |
| 9 |
Identity Testing for Constant-Width, and Commutative, Read-Once Oblivious ABPs |
Gurjar, Rohit et al. |
2016 |
| 10 |
Integer Factoring Using Small Algebraic Dependencies |
Agrawal, Manindra et al. |
2016 |
| 11 |
Deterministic Identity Testing for Sum of Read-once Oblivious Arithmetic Branching Programs |
Gurjar, Rohit et al. |
2015 |
| 12 |
The Power of Depth 2 Circuits over Algebras |
Saha, Chandan et al. |
2009 |
| 13 |
Diagonal Circuit Identity Testing and Lower Bounds |
Saxena, Nitin |
2008 |
